Map

Capture Statistics for Wave Gate Metrics

A gate, with a gate date and a percentage complete, allows a user to evaluate the current mapping status against a customizable goal.

Map’s Snap Shot process captures mapping statistics at a specific point in time to measure against Gate Wave metrics for field mapping and value mapping.

A service page also runs once daily to capture mapping statistics, but a user can run the process at any time.

Wave Gate metrics are set up in Console. Refer to Set Up Wave Gate Metrics for Map for more information.

To use Wave Gate metrics:

  1. Enter the GATE NAME, the GATE DATE and the GATE PERCENTAGE for value mapping and field mapping in Console.
  2. Run the Snap Shot process in Map to gather current mapping status (instructions below).

  3. View the current mapping status in relation to the gate metrics on the Wave Gate Metrics (Value Mapping) page and the Wave Gate Metrics (Field Mapping) page.

    NOTE: These pages can be viewed in Map by clicking Metrics on the Process Area Launch page. Click Gate Value Metrics or Gate Field Metrics. These pages open as display only when accessed in Map. Wave Gate metrics can only be edited in Console.

To run the Snap Shot process in Map:

  1. Click Map in the Context bar.
  2. Click the Metrics icon on the Process Area Launch page.
  3. Click the Process icon; a confirmation message displays.
  4. Click OK.

To view Wave Gate metrics for the last time the Snap Shot process ran, click Gate Field Mapping or Gate Value Mapping on the Metrics and Reports Landing page.

To view daily, weekly and monthly reports with Snap Shot statistics, click Metrics on the Metrics and Reports Landing page.

NOTE: The data on these reports is captured when a service page runs daily to update the gate percentage or when a user runs the Snap Shot process.